The EST-300 hipot tester’s compact size does not compromise the device’s performance or reliability. The series delivers high testing efficiencies that show in every detail. The built-in ARC detection feature — utilized by many top-tier manufactures – detects abnormal circuit shorts, preventing poor gap spacing that can cause dielectric breakdowns while enhancing quality assurance. The ramp-high and charge-low functions increase efficiency, eliminating common errors from the DUT’s test results caused by current overshoots and faulty connections.
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