Hệ thống vi thao tác bán tự động Micromanipulator Probe Station P300J

The system supports a wide choice of options, and is even backward compatible with accessories (manipulators, probe holders, probe card holders) from our industry-standard 4000 and 8000 series (200mm) stations.

The station includes an adjustable microscope lift delay which prevents driving the probes into the microscope objective, a feature that Micromanipulator pioneered, and which is a hallmark of our professional probing systems.

The P300J may be configured for thermal applications, including our Micromanipulator’s “Top Hat” for low level, frost free below ambient testing.  Three temperature ranges are supported:

• Ambient (room temperature) to 300C
• 0C to 300C
• -55C to 300C

The P300J is the platform of choice for companies who need to probe whole 300mm wafers, but don’t require a semiautomatic probe station for large volume tests.