X-ray Inspection System Anritsu KD7416DWZ

• The DualX analyzes two X-ray signals – both a high and low energy – for a higher detection rate of low-density items, as well as contaminants not previously detectable by standard X-ray systems.

Principle and features of dual energy sensor system

• Different materials have varying energy-dependent x-ray attenuation coefficients. X-ray images acquired at high energy and low energy will exhibit different attenuation characteristics.
• The x-rays generated from an x-ray inspection system have several energy levels. The dual energy inspection system produces two different images from two different energy x-rays simultaneously.
• High energy x-rays produce a brighter image and low energy x-rays produces a darker image. By subtracting the two images acquired at different energies, the system eliminates an image having the same gray level, leaving only contaminants.
• The dual energy technology delivers the following unique features compared to conventional X-ray technology:
• (1) Low density items can be detected.
• (2) Even overlapping products can be inspected without false rejecting.