Source Measure Units Siglent SMM3311X 10fA/100nV

Source Measure Units SMM3311X

In pulse mode, the SMM3000X series delivers ±10.5 A pulsed current output with a minimum pulse width of 50 μs, enabling accurate emulation of transient operating conditions for power devices—such as switching loss characterization of GaN (gallium nitride) and SiC (silicon carbide) components—thereby providing robust support for power semiconductor R&D and testing.

The SMM3000X series supports both linear and logarithmic sweep modes, generating point-by-point voltage or current output from user-defined start to stop values at a fixed step size while automatically measuring and logging data at each point. This facilitates rapid characterization of semiconductor devices—such as diodes and transistors—across varying operating points, enabling acquisition of conduction (I‑V) curves for performance analysis and optimization.

List Mode allows users to define custom output sequences with a minimum interval of 10 μs. Parameter transitions can follow linear, non-linear, arbitrary, or fully user-specified patterns. The instrument sequentially outputs the programmed voltage or current values while simultaneously measuring and recording data—ideal for irregular transient tests and multi-segment stress profiling.

The SMM3000X series provides multiple display modes—Graph, Roll, and Measurement Results views—for comprehensive data analysis. The Graph view enables real-time curve plotting of mathematical operations, the Roll view displays time-domain waveforms, and the Measurement Results view presents statistical summaries of trace data. This multi-view architecture supports multi-dimensional parameter analysis for intuitive interpretation of test results.

Built on an advanced SCPI command set, the SMM3000X series supports remote control via USB and LAN interfaces. Users can operate the instrument through an embedded Web Server for quick setup or implement deep customization via SCPI programming to meet diverse test requirements. Socket communication over TCP/IP further enables seamless network integration for robust remote testing and control.