Description
The FD340 Digital Ultrasonic Flaw Detector combines HUATEC’ industry leading conventional flaw detection capabilities with the efficiency of a highly portable, intuitive instrument. The FD340 flaw detector’s blend of efficient menus and direct access keys allows you to take advantage of the highest quality flaw detection platform with exceptional ease of use.
• Simple to use, quick to operate, from basic to challenging inspection requirements.
• From high frequency inspections for thin materials up to low frequency for attenuative materials.
• From automotive, power generation, oil and gas to aerospace applications.
Specification
Ranges:0.5 to 10,000 mm (steel) range selectable in fixed steps or continuously variable
Material velocity:1,000 to 15,000 m/s,continuously variable in steps of 1 m/s and 22 selectable material velocities
Display delay:From -5 to 1,000μs
Probe delay:0 to 200 μs
Auto calibration:Measurement and setting of sound velocity and probe delay using two known calibration echoes (2-point calibration)
Pulse energy (Spike mode):Low energy (70V), High energy(500V)
Square wave excitation pulse (option)
Pulse Voltage 20 to 500 V adjustable in 10 V increments
Pulse Width Tunable from 20 to 1000 ns in 10 ns increments
Damping:Low(50 ohms), High(500 ohms):(1,000 ohms in TR mode)
Pulse repetition frequency:20 to 1K Hz
Frequency ranges (-3 dB):0.2 to 1 MHz,0.5 to 4 MHz,2 to 20 MHz
Gain:0 to 110 dB adjustable in selectable steps 0.5, 1.0, 2.0, 6.0, 12.0, user definable, and locked (step 0).
Rectification:Full-wave, negative half-wave, positive half-wave and RF mode
Reject:Linear, 0 to 90 % screen height Variable in steps of 1 %
Monitor gates:2 independent gates in color bar mode, start and width variable over the entire calibration range, response threshold of 5 to 95 % screen height variable in steps of 1 %,
Alarm:Alarm signal via LED and connectable internal horn. Alarm mode of positive logic, negative logic or DAC
Zoom Expands A-scan display area for increased screen resolution.
Magnify:Expands area within the selected gate over the entire display range for increased A-scan resolution.