Semiconductor C-V Characteristic Analyzer TongHui TH513

Features

• 10.1-inch capacitive touch screen, resolution 1280*800, Linux system

• Dual CPU architecture, the fastest test speed of LCR function is 0.56ms

• Three test methods: spot test, list scan, and graphic scan (option)

• Four parasitic parameters (Ciss, Coss, Crss, Rg) are measured and displayed on the same screen

• CV curve scan, Ciss-Rg curve scan

• Integrated design: LCR + VGS low voltage source + VDS high voltage source + channel switching + PC

• Standard 2-channel test, which can test two devices or dual-chip devices at the same time, the channel can be expanded to 6, channel parameters are stored separately

• Fast charging, shortens capacitor charging time and enables fast testing

• Automatic delay setting

• High Bias: VGS: 0 – ±40V, VDS: 0 – 200V/1500V/3000V

• 10 bin sorting

Applications

• Semiconductor components/Power components

Parasitic capacitance test and C-V characteristic analysis of diodes, triodes, MOSFETs, IGBTs, thyristors, integrated circuits, optoelectronic chips, etc.

• Semiconductor material

Wafer, C-V characteristic analysis

• Liquid crystal material

Elastic constant analysis

• Capacitive element

Capacitor C-V characteristic test and analysis, capacitive sensor test and analysis