Production test system for digital sensors Spektra S-TEST 16

Scalable end-of-line system level tests for sensor mass production.

Compact system level test solution (SLT) for sensors with digital interfaces. Typical fields of application are mass production tests of sensors and quality assurance in sensor production.

The S-TEST 16 Fab systems are designed for use in sensor mass production. Their optimized design allows operation in temperature-controlled switch cabinets. Variable throughput rates and test coverages can be realized ranging from small test series to highly parallel testing of several hundred sensors.

The end-of-line test in the production of modern MEMS sensors involves a large number of completely different stimuli. The S-TEST systems can therefore be used flexibly for all stimuli and handling systems. Whether the sensor measures pressure, acceleration, light or acoustic values, S-TEST systems can be used to test a wide variety of digital sensors.

The subcomponents of the S-TEST system are optimized to suit digital MEMS sensor testing. The concentration of all necessary measuring functions on one highly efficient measuring card forms the basis for cost-optimized testing. Additional efficiency is achieved by a combined interface card, which allows data communication, easy system firmware updates and calibration of the entire system.

To shorten the setup time of an S-TEST 16 Fab system, SPEKTRA offers a wide range of different cables, adapters and accessories. In this way, sensors with standard housings can be prepared more quickly for mass testing and handling systems can be equipped with impedance-matched measuring cables. SPEKTRA also supplies autonomous calibration equipment to simplify the calibration and maintenance of S-TEST systems.

Product details

• Can hold 16 UTB cards to connect up to 64 sensors (4 sensors per card)
• Ethernet Interface card (ETH) for system communication, test and firmware loading and self-calibration
• Integrated power supply
• LED system status indicators
• Integrated fan
• Parallel sampling with timestamp