Technical Parameter
Model | TH2810B+ |
Basic Accuracy | 0.1% |
Test Frequency | 100Hz,120Hz,1kHz,10kHz |
Test Parameters | L, C, R,Z|, D, Q, X, θd, θr, Vm, Im, △% |
V/I Monitor | Yes |
AC Test Signal Level | 0.1Vrms,0.3Vrms,1Vrms |
Signal Source Internal Resistance | 10Ω, 100Ω |
Test Terminal Configuration | 5-terminal |
Test Speed(ms/time) | Fast: 19ms; Medium:83ms; Slow: 333msF≤120Hz Fast :4XT+3ms |
Zero Clearing | Open, Short, Load |
List Sweep | 10-point list sweep; Each scan point can be individually sorted, support multi-frequency combined test sorting; Scanning test for frequency and AC voltage |
EquivalentCircuit | Series, Parallel |
Range Mode | AUTO, HOLD |
Trigger Mode | Internal, External, Manual, Bus |
Average Times | 1-255 |
Arithmetical Operation | Direct reading, △ABS,△% |
Delay | Trigger delay, step delay: 0—60.000s, 1ms step |
General Function | Series, parallel equivalent mode, calibration: open circuit, short circuit, range selection: automatic, manual, trigger mode: INT, MAN,EXT, BUS, keyboard lock function |
Comparator | 10 bins sorting,BIN1-BIN9,NG,AUX; Bin count function PASS, FALL front panel LED display |
Nonvolatile Storage | 100 sets of LCRZ instrument setting files, 10 test results |
External USB Storage | Instrument setting file, CSV data file |