The Keysight B1500A semiconductor parameter analyzer is an all-in-one device characterization analyzer supporting IV, CV, pulse/dynamic IV and more. The mainframe and plug-in modules enable characterization of most electronic devices, as well as materials, semiconductors, and active/passive components. The B1500A modular architecture gives you the flexibility to upgrade when needed.
Faster pulsed measurement down to 50 µs pulse width and wide range up to 30 V/1 A
The 50 µs Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 µs pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
Oscilloscope view for confidently timing precision pulsed IV measurement
The oscilloscope view displays measured MCSMU module current and voltage data versus time. The pulsed measurement waveforms appear in a separate window for easy verification of the measurement timings. This function is useful for verifying waveform, optimizing timing parameters, and debugging pulsed measurements. The oscilloscope view can display the pulsed waveform timings at any user specified sweep step of the sweep output. It is available in the tracer test mode of the EasyEXPERT.