Technical Parameter
Model | TH2817B+ | TH2817B | |
Basic Accuracy | 0.1% | ||
Test Frequency | 50Hz,60Hz,100Hz,120Hz,1kHz,10kHz,20kHz,40kHz, 50kHz,100kHz, total 10 points | ||
Test Parameters | L, C, R,Z|, D, Q, X, θd, θr, Vm, Im, △% | L, C, R,Z|, Q, D, X, θ | |
V/I Monitor | Yes | —— | |
AC Test Signal Level | 0.1Vrms,0.3Vrms,1Vrms | ||
Test Terminal Configuration | 5-terminal | ||
Test Speed (ms/time) | Fast: 19ms; Medium:83ms; Slow: 333msF≤120Hz Fast :4XT+3ms | Fast: 50ms; Medium:125ms; Slow: 500ms | |
Zero Clearing | Open, Short, Load | Open, Short | |
List Sweep | 10-point list sweepEach scan point can be individually sorted, support multi-frequency combined test sorting Scanning test for frequency and AC voltage | —— | |
Equivalent Circuit | Series, Parallel | ||
Range Mode | AUTO, HOLD | ||
Trigger Mode | Internal, External, Manual, Bus | ||
Average Times | 1-255 | —— | |
Arithmetical Operation | Direct reading, △ABS, △% | Direct reading, △% | |
Delay | Trigger delay, step delay: 0—60.000s, 1ms step | —— | |
General Function | Series, parallel equivalent mode, calibration: open circuit, short circuit, range selection: automatic, manual, trigger mode: INT, MAN, EXT, BUS, keyboard lock function | ||
Comparator | bins sorting, BIN1-BIN9, NG, AUX; Bin count function PASS, FALL front panel LED display | bins sorting, PASS/FAIL instructions | |
Memory | Nonvolatile Storage | sets of LCRZ instrument setting files | ten groups of the instrument setting file |
USB Storage | Instrument setting files, measurement result CSV files | —— | |
Interface | RS232/RS485(option), HANDLER, USB HOST, USB DEVICE | RS232,HANDLER,GPIB(option) |