Test system for digital sensors Spektra S-TEST Lab AHF

S-TEST Lab AHF

Based on our high-frequency exciters SE-09 and SE-11, the S-TEST Lab AHF systems are a perfect fit for calibration and characterization of MEMS, digital sensors and other small components. Those typical systems were especially designed for system testing at high frequencies.

• Force rating 100 N
• Frequency range: SE-09: 3 Hz … 50 (95) kHz / SE-11: 1 kHz … 50 (95) kHz
• Sample rate 120/200 kS/s
• 24 Bit resolution
• SE-11 eligible for climate chamber
• Remote control for climate chamber

Software highlights

• Wide range of functions for R&D
• Sweep, Dwell, manual mode, script operation and remote control
• Spectral analysis and distortion factor measurement
• Supports laser vibrometer
• Spectral RMS measurement
• Extensive display functions
• Powerful filters